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LED&Semiconductor Industry
APD-QE
APD-QE adopts the spatial light homogenizing technology and follows the ASTM standard “Irradiance Mode” test method, which is proven that it can accurately perform quantum efficiency and other key parameter measurements of advanced photodetectors. APD-QE can combine with various advanced probe stations to deliver a complete testing solution for many advanced photodetectors, such as iPhone LiDAR and a its variety of light sensors, Apple Watch blood oxygen light sensor, TFT image sensor, active ac
Features：
• Uniform light spot can overcome the problems of chromatic dispersion and aberration, which can accurately, compared to traditional focused beam spot, measure the EQE curve of micrometer-level photodetectors.
• It can be matched with a variety of probe station systems to achieve non-destructive and rapid testing.
• The integrated optics and test system improve the efficiency of system construction.
• One-key automatic test software, automatic full spectrum calibration and measurement, high work efficiency.
• Test characteristics:
– External quantum efficiency EQE
– Spectral response SR
– I-V curve measurement
– NEP spectrum measurement
– D*spectrum measurement
– Noise-current-frequency response graph (A/Hz-1/2; 0.01Hz~1,000Hz)
– Flicker noise, Johnson Noise, Shot noise analysis
Specification
Main system:
• Quantum Efficiency Testing System
– 300nm ~ 1100nm (expandable to 2500nm)
• Software:
– PDSW software
– Upgradable to FETOS-SW (3T or 4T devices)
• Probe station system (option)
– 4” standard probe station (MPS-4-S)
• Customized integration solution combining probe stage and shielding dark box.
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Hong Kong Headquarters
Address: 13A Weswick Commercial Building, No.147 Queen's Road East, Wanchai, Hong Kong
Telephone:+852 28662978
Fax:+852 28662013
Email:admin@bb-technology.com.hk
Xiamen Office
Telephone:+86 (592) 5083007/5083006
Taiwan Office
Telephone:+886-2-77253668
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